Image analysis – Pattern recognition – Feature extraction
Patent
1996-02-20
1998-08-04
Boudreau, Leo H.
Image analysis
Pattern recognition
Feature extraction
345433, 345438, G06K 946, G06T 1100, G06T 320
Patent
active
057907005
ABSTRACT:
In a line-symmetrical figure shaping system, the symmetry axis candidate pairs of an input figure are generated based on feature data extracted from the input figure. Pairs of points on the input figure on both sides of each of two symmetry axis candidates of a selected symmetry axis candidate are extracted, and a symmetry axis judgment segment is generated which connects the points of each pair. The distance between the middle point of the symmetry judgment segment and the symmetry axis candidate is calculated. The angle formed by the symmetry judgment segment and the symmetry axis candidate and the difference from 90.degree. are also calculated. Based on the distances and angular differences for the respective symmetry judgment segments, it is judged whether the input figure is symmetrical with respect to the symmetry axis candidate pair. The input figure is shaped into a figure that is completely line-symmetrical with respect to the symmetry axis candidate pair that has been judged to provide line symmetry.
REFERENCES:
patent: 4797842 (1989-01-01), Nackman et al.
Boudreau Leo H.
Le Nhan
NEC Corporation
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