Method for automatic open-circuit detection

Details Method for automatic open-circuit detection Method for automatic open-circuit detection

1993-02-05

1995-05-09

Voeltz, Emanuel T.

Excavating

371 221, 371 226, 371 27, G06F 1100

Patent

active

054147158

ABSTRACT:
When an automatic circuit tester (10) detects that a fault has occurred in a circuit board (14), it applies to the circuit board (14) a sequence of vectors that differs from the test sequence (T.sub.n, T.sub.n+1) by which the fault detection occurs only in that each vector's component that corresponds to an input pin in question on the board device under test maintains a level that simulates an open circuit at that input pin. If the resultant response differs from the response to the original test sequence, the input pin can often be ruled out as one at which a fault has occurred. In this way, many open-circuit faults at input pins can be diagnosed without special probing, even when several such faults occur simultaneously.

REFERENCES:
patent: 4937826 (1990-06-01), Gheewala et al.
patent: 5058112 (1991-10-01), Namitz et al.
patent: 5321701 (1994-06-01), Raymond et al.
GenRad, Inc., "GR228X Test Set Preparation Manual", Instruction Manual, Version 1.6, Nov. 27, 1992.
Soviet Inventions Illustrated, E1 section, week 8730, Sep. 9, 1987, Derwent Publications Ltd., London.
Soviet Inventions Illustrated, E1 section, week C 34, Oct. 1, 1980, Dervent Publications Ltd., London.

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