Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2011-06-28
2011-06-28
Strege, John B (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S195000, C382S224000, C382S277000
Reexamination Certificate
active
07970212
ABSTRACT:
The invention is a method of using Wavelet Transformation and Artificial Neural Network (ANN) systems for automatic detecting and classifying objects. To train the system in object recognition different images, which usually contain desired objects alongside other objects are used. These objects may appear at different angles. Different characteristics regarding the objects are extracted from the images and stored in a data bank. The system then determines the extent to which each inserted characteristic will be useful in future recognition and determines its relative weight. After the initial insertion of data, the operator tests the system with a set of new images, some of which contain the class objects and some of which contain similar and/or dissimilar objects of different classification. The system learns from the images containing similar objects of different classes as well as from the images containing the class objects, since each specific class characteristic needs to be set apart from other class characteristic. The system may be tested and trained again and again until the operator is satisfied with the system's success rate of object recognition and classification.
REFERENCES:
patent: 7043075 (2006-05-01), Gutta
Second European Office Action for parallel application 06821604.3 dated Sep. 30, 2009.
Phuvan S. et al; “Optoelectronic Fractal Scanning Technique for Wavelet Transform and Neural Net Pattern Classifiers”; Proceedings of the International Joint Conference on Neural Networks, Baltimore Jun. 7-11, 1992; vol. 3, pp. 40-46; IEEE New York, N.Y.
Murroni M. et al; “Region-based Image Coding for Remote Sensing”; Image Processing and Its Applications, 1999, Seventh International Conference; Jul. 1999 vol. 2 pp. 808-812, IEEE London, U.K.
Lamarque, C-H et al; “Image Analysis Using Space-Filling Curves and 1D Wavelet Bases”; Pattern Recognition, Aug. 1997, vol. 29, No. 8, pp. 1309-1322, Elsevier, Kidlington, Great Britain.
Ewa Skubalska-Rafajlowicz; “Pattern Recognition Algorithm Based on Space Filling Curves and Orthogonal Expansions”; IEEE Transactions on Information Theory; Jul. 2001, vol. 47, No. 5, pp. 1915-1927; New York.
Ebrahim, Y. et al; “Shape Representation and Matching of 3D Objects for Computer Vision Applications”; WSEAS Transactions on Information Science and Applications; vol. 2, No. 9, Sep. 2005; Corlu, Greece.
Michel, Misiti et al; “Les Ondelettes et Leurs Applications: 5.2.2. Applicataion a la Detection De Formes”; Hermes Science Publications, pp. 141-148; 2003; Paris.
Michel, Misiti et al; “8. Traitement D'image Par Ondelettes: Les Ondelettes et Leurs Applications”; Hermes Science Publications, pp. 247-258; 2003; Paris.
Gonzalez R. C. et al; “Digital Image Processing: Introduction”; Prentice Hall, 2002; pp. 1-33; 527, 653; Upper Saddle River, N.J.
Israel Patent Office First Office Action Dated Jan. 6, 2010—parallel case 172480.
European Patent Office Invitation to Attend Oral Proceedings in Parallel European Patent Case 06821604.3, dated Sep. 6, 2010.
Nissim Shai
Zahavi Amir
Kahn Simon
Strege John B
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