Measuring and testing – Testing of apparatus
Reexamination Certificate
2007-05-08
2007-05-08
Williams, Hezron (Department: 2856)
Measuring and testing
Testing of apparatus
C700S121000, C073S001010
Reexamination Certificate
active
10776452
ABSTRACT:
A method of automatically configuring an Advanced Process Control (APC) system for a semiconductor manufacturing environment in which an auto-configuration script is generated for executing an auto-configuration program. The auto-configuration script activates default values for input to the auto-configuration program. The auto-configuration script is executed to generate an enabled parameter file output from the auto-configuration program. The enabled parameter file identifies parameters for statistical process control (SPC) chart generation.
REFERENCES:
patent: 5355320 (1994-10-01), Erjavic et al.
patent: 5461570 (1995-10-01), Wang et al.
patent: 5586041 (1996-12-01), Mangrulkar
patent: 6098116 (2000-08-01), Nixon et al.
patent: 6263255 (2001-07-01), Tan et al.
patent: 6445969 (2002-09-01), Kenney et al.
patent: 6556884 (2003-04-01), Miller et al.
patent: 6560503 (2003-05-01), Toprac et al.
patent: 6622059 (2003-09-01), Toprac et al.
patent: 6647309 (2003-11-01), Bone
patent: 6704920 (2004-03-01), Brill et al.
patent: 6804619 (2004-10-01), Chong et al.
patent: 6871112 (2005-03-01), Coss et al.
patent: 6944662 (2005-09-01), Devine et al.
patent: 2005/0187649 (2005-08-01), Funk et al.
patent: 2006/0079983 (2006-04-01), Willis
patent: 0 643 344 (1995-03-01), None
patent: 0 686 900 (1995-12-01), None
patent: WO 01/25865 (2001-04-01), None
“Features and Benefits,” Internet Article, http://web.archive.org/web20020815010634/www.wonderware.com/products/analytical/qianalyst/features.asp. (XP002308756), 16 pp, (Aug. 15, 2002).
“Industrial SQL Server 8.0,” Internet Article, http://web/archiv.org/20021001201810/www.wonderware.com/products/historian/insq1 (XP002311924), 8 pp, (Oct. 1, 2002).
Fraleigh, Steven et al., “Visual programming of on-line systems for continuous process improvement,” Proceedings, Conference on Control Applications, IEEE (New York), vol. 2 (No. 3), pp. 1289-1295, (Aug. 24-26, 1994).
U.S. Appl. No. 60/414,425, filed Sep. 30, 2002, Funk.
U.S. Appl. No. 60/393,104, filed Jul. 3, 2002, Funk.
U.S. Appl. No. 60/393,091, filed Jul. 3, 2002, Funk.
U.S. Appl. No. 60/383,619, filed May 29, 2002, Funk.
U.S. Appl. No. 60/374,486, filed Apr. 23, 2002, Funk.
U.S. Appl. No. 60/368,162, filed Mar. 29, 2002, Funk.
U.S. Appl. No. 60/404,412, filed Aug. 20, 2002, Funk.
Chamness Kevin Andrew
Fatke David
Harada Satoshi
Hume, III Edward C.
Lam Hieu A
Frank Rodney
Pillsbury Winthrop Shaw & Pittman LLP
Tokyo Electron Limited
Williams Hezron
LandOfFree
Method for automatic configuration of processing system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for automatic configuration of processing system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for automatic configuration of processing system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3767855