Data processing: measuring – calibrating – or testing – Calibration or correction system – Position measurement
Reexamination Certificate
2005-08-30
2005-08-30
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Position measurement
C702S033000, C702S019000, C422S063000, C422S062000, C422S051000, C436S043000, C436S054000, C073S864010
Reexamination Certificate
active
06937955
ABSTRACT:
A method for calibrating a clinical analyzer having a dispenser, and for automatically aligning the dispenser of the clinical analyzer includes loading a calibration element at a portion of the clinical analyzer; moving a dispenser of the clinical analyzer in a pre-determined direction (Y) to a position over the calibration element; measuring the height (Z) from the dispenser to the calibration element and determining a position coordinate (Yi,Zi); storing the position coordinate (Yi,Zi); determining a maximum height (Zmax) for the dispenser positioned over the calibration element defined as position coordinate (Yopt, Zmax); and storing the position coordinate including the maximum height (Zmax) for the dispenser positioned over the calibration element.
REFERENCES:
patent: 3894438 (1975-07-01), Ginsberg
patent: 4190889 (1980-02-01), Etoh et al.
patent: 4281385 (1981-07-01), Nakaso et al.
patent: 4340390 (1982-07-01), Collins et al.
patent: 4631483 (1986-12-01), Proni et al.
patent: 4790183 (1988-12-01), Pfost et al.
patent: 4794085 (1988-12-01), Jessop et al.
patent: 5138868 (1992-08-01), Long
patent: 5143849 (1992-09-01), Barry et al.
patent: 5246316 (1993-09-01), Smith
patent: 5270210 (1993-12-01), Weyrauch et al.
patent: 5334349 (1994-08-01), Kelln et al.
patent: 5443791 (1995-08-01), Guiremand et al.
patent: 5465629 (1995-11-01), Waylett, Jr.
patent: 5526072 (1996-06-01), El Hage
patent: 5627522 (1997-05-01), Walker et al.
patent: 5646049 (1997-07-01), Tayi
patent: 5736403 (1998-04-01), Hyde et al.
patent: 5753512 (1998-05-01), Riall et al.
patent: 5846492 (1998-12-01), Jacobs et al.
patent: 5885530 (1999-03-01), Babson et al.
patent: 5939326 (1999-08-01), Chupp et al.
patent: 2002/0009391 (2002-01-01), Marquiss et al.
patent: 2002/0176801 (2002-11-01), Giebeler et al.
European Search Report, dated Apr. 5, 2004, for European Appln. No. EP 03 26 1997.
Burns Todd J.
Capezutto Louis J.
Desta Elias
Hoff Marc S.
Ortho-Clinical Diagnostics, Inc.
LandOfFree
Method for automatic alignment of metering system for a... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for automatic alignment of metering system for a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for automatic alignment of metering system for a... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3501911