Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2007-01-23
2009-06-09
Lauchman, L. G (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
C356S511000, C356S500000
Reexamination Certificate
active
07545512
ABSTRACT:
A method of measuring a 3D shape includes the steps of measuring a brightness of a first illumination source41a, measuring a phase-to-height conversion factor, measuring a 3D shape of a circuit board62according to the normal inspection mode, and determining whether bare board information about the circuit board62is included. If the information is not included, performing bare board teaching to acquire the information. Then, the 3D shape of target objects on the circuit board62are measured, when the bare board information is included or bare board teaching information is generated. Next, the circuit board62is analyzed to determine if it is normal or abnormal by using 3D shape information.
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Han Se Hyun
Kim Hee Tae
Kim Min Young
Lee Seung Jun
Yoo Byung Min
Koh Young Technology Inc.
Lauchman L. G
Rosenberg , Klein & Lee
Slomski Rebecca C
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