Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-04-04
2006-04-04
Wu, Jingge (Department: 2625)
Image analysis
Applications
Manufacturing or product inspection
C382S154000, C382S285000, C348S042000, C348S051000
Reexamination Certificate
active
07024032
ABSTRACT:
An automated method is provided for assessing fit and alignment of an assembly component in relation to its assembly environment. The method includes: collecting measurement data for the assembly component; defining model data representative of an assembly environment, where the assembly environment is defined by surfaces of objects that are adjacent to the assembly component in an assembled configuration; and comparing the measurement data with the model data for the assembly environment, thereby assessing the assembly component in relation to its assembly environment.
REFERENCES:
patent: 4639878 (1987-01-01), Day et al.
patent: 5125298 (1992-06-01), Smith
patent: 5340174 (1994-08-01), Bender et al.
patent: 5706325 (1998-01-01), Hu
patent: 5829114 (1998-11-01), Kleefeldt
patent: 5881780 (1999-03-01), Matye et al.
patent: 6166811 (2000-12-01), Long et al.
patent: 6473978 (2002-11-01), Maas
Kidd John H.
Lin George
Mykytiuk Mark
Harness & Dickey & Pierce P.L.C.
Kassa Yosef
Perceptron, Inc.
Wu Jingge
LandOfFree
Method for assessing fit and alignment of a manufactured part does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for assessing fit and alignment of a manufactured part, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for assessing fit and alignment of a manufactured part will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3549656