Optics: measuring and testing – By polarized light examination – With polariscopes
Patent
1994-08-26
1995-11-28
Rosenberger, Richard A.
Optics: measuring and testing
By polarized light examination
With polariscopes
G02F 109
Patent
active
054713064
ABSTRACT:
A method for assembling an optical isolator comprises a step for constructing a measuring system in which a light source, a lens system, a polarizer, an analyzer, and a light receiver are arranged in this order, and light projected from the light source and then transmitted through the lens system, the polarizer, and the analyzer, is received by the light receiver; a step for arranging optical elements for constituting a main body of the optical isolator between the polarizer and the analyzer; a step for measuring a maximum value and a minimum value in levels of the light received by the light receiver while the analyzer is rotated, thereby calculating a ratio of the minimum value to the maximum value; and a step for adjusting rotation positions of the respective components for constituting the main body of the optical isolator in order that the ratio becomes minimal.
REFERENCES:
patent: 5278853 (1994-01-01), Shirai et al.
patent: 5298972 (1994-03-01), Heffner
patent: 5386484 (1995-01-01), Ooka et al.
Dexter et al., "Ultraviolet Optical Isolators Utilizing KDP-Isomorphs", Optics Communications, vol. 80, No. 2, Dec. 15, 1990, pp. 115-118.
Kuwahara et al., "An Optical Isolator for Semiconductor Lasers in the 0.8 .mu.m Range", Optics Communications, vol. 40 No. 2, Dec. 1981, pp. 99-104.
Hirai Shigeru
Semura Shigeru
Yui Dai
Rosenberger Richard A.
Sumitomo Electric Industries Ltd.
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