Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-10-24
2010-06-01
Tang, Minh N (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S757020, C324S758010
Reexamination Certificate
active
07728608
ABSTRACT:
A method for assembling an electrical connecting apparatus having a support member, a probe board, and spacers arranged between the support member and the probe board. A height of at least either each abutting part of the support member or each abutting part of the probe board facing the abutting part is measured, and a length of each of the plurality of spacers is measured. Based on measurement values obtained by these measurements, a spacer appropriate for maintaining tips of numerous probes provided on the probe board on the same plane is selected for each pair of the both abutting parts.
REFERENCES:
patent: 6509751 (2003-01-01), Mathieu et al.
patent: 07-050324 (1995-02-01), None
patent: 2001-076787 (2001-03-01), None
patent: 2003-123921 (2003-04-01), None
patent: 01/717779 (2001-09-01), None
patent: 2006/126279 (2006-11-01), None
Kabushiki Naisha Nihon Micronics
Stolowitz Ford Cowger LLP
Tang Minh N
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