Optical: systems and elements – Deflection using a moving element – Using a periodically moving element
Reexamination Certificate
2005-02-22
2005-02-22
Robinson, Mark A. (Department: 2872)
Optical: systems and elements
Deflection using a moving element
Using a periodically moving element
C359S368000
Reexamination Certificate
active
06859294
ABSTRACT:
A scanning microscope is disclosed. The scanning microscope comprises a light source which emits an illuminating light beam for illumination of a specimen, a resonant beam deflection device, for guiding the illuminating light beam over the specimen, which has a resonant frequency and a resonant frequency range, and an independent oscillator with which a drive oscillation, which has a drive frequency within the resonant frequency range can be generated which drives the beam deflection device. Furthermore a method is disclosed for controlling a scanning microscope having a resonant beam deflection.
REFERENCES:
patent: 5121138 (1992-06-01), Schermer et al.
patent: 5225923 (1993-07-01), Montagu
patent: 5629790 (1997-05-01), Neukermans et al.
patent: 6037583 (2000-03-01), Moehler et al.
patent: 6040567 (2000-03-01), Neher et al.
patent: 6547145 (2003-04-01), Colley et al.
patent: 6653621 (2003-11-01), Wine et al.
patent: 4116387 (1991-12-01), None
patent: 4322694 (1994-01-01), None
patent: 19702752 (1998-07-01), None
patent: 19710714 (1998-09-01), None
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