Method for ascertaining information about a device exposed...

Details Method for ascertaining information about a device exposed... Method for ascertaining information about a device exposed...

2005-10-11

2009-12-08

Allen, Andre J (Department: 2855)

Thermal measuring and testing

Temperature measurement

Composite temperature-related paramenter

C374S107000

Reexamination Certificate

active

07628535

ABSTRACT:
A method for ascertaining information about a device that has been exposed to a temperature, permitting a simple and reliable means of ascertaining information about the aging of the device. The temperature of the device is determined. Depending on the temperature or the temperature change achieved by the device, at least one counter is incremented. Information about the aging of the device is ascertained as a function of the counter reading achieved.

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