Method for anodic oxidation

Electrolysis: processes – compositions used therein – and methods – Electrolytic coating – Involving measuring – analyzing – or testing

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205116, 205145, C25D 1102, C25D 2112

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active

055037305

ABSTRACT:
Disclosed are a method and an apparatus for forming a specular protective film in which the intensity of reflected light is made even with a variation in the angle of incidence of the incident light. In the anodic oxidation treatment, the current value applied to a plurality of specular parts is sampled at a predetermined interval (S301), and each sampled value is integrated over time (S302) and the average value is obtained. A comparison is made between an obtained average value and a preset value, and if the average value is greater, the application of current to all the specular parts is stopped (S303). The preset value is the amount of electricity conducted to form an anodic oxide film having a film thickness corresponding to a desired reflectance which is determined from the relation between the preset film thickness of anodic oxide film and the reflectance. Also, a process for checking to see whether or not the voltage produced by applying the current to each specular part at the start of anodic oxidation treatment is at a predetermined rise slope (S304 to S310), and a process for correcting the current applied to each specular part so as to be equal to the average value during the anodic oxidation treatment are provided (S311 to S315).

REFERENCES:
patent: 4192729 (1980-03-01), Cancelleri et al.
patent: 4545876 (1985-10-01), McGivern, Jr.
Patent Abstracts of Japan, vol. 8, No. 119, Oct. 5, 1984 (JP-A-59 101 603).
Patent Abstracts of Japan, vol. 12, No. 181, May 27, 1988 (JP-A-62 287 098).

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