Method for analyzing organic light-emitting device

Details Method for analyzing organic light-emitting device Method for analyzing organic light-emitting device

2006-12-12

2006-12-12

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

Reexamination Certificate

active

07148719

ABSTRACT:
Provided is a method for analyzing the performance of an OLED through activation in-situ. The method includes placing the OLED in an in-situ chamber, driving the OLED, and analyzing a dark spot and/or thermal degradation of the OLED, such that performance of the OLED can be analyzed while driving the OLED in-situ, separated from the external environment.

REFERENCES:
patent: 5459408 (1995-10-01), Chen
patent: 6818329 (2004-11-01), Liao et al.
patent: 6918946 (2005-07-01), Korgel et al.
patent: 2004/0097160 (2004-05-01), Kaltenbach et al.
patent: 2005/0048862 (2005-03-01), Phelan et al.

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