Method for analyzing materials using x-ray fluorescence

Details Method for analyzing materials using x-ray fluorescence Method for analyzing materials using x-ray fluorescence

1988-08-01

1991-05-07

Wallace, Linda J.

X-ray or gamma ray systems or devices

Specific application

Fluorescence

378 49, G01N 23223

Patent

active

H00009229

ABSTRACT:
A method of identifying the presence, and amount, of elemental constituents in a material. The method uses an apparatus known for use in measuring extended x-ray absorption fine structure, and adapts it to the measurement of x-ray appearance potential in a manner to yield both qualitative and quantitative information about the elemental constituents of the material. The source of x-rays can be a synchrotron, which, because of its high power output, increases the speed and sensitivity of the measurements, permitting the use of less sensitive x-ray detectors to yield statistically significant data.

REFERENCES:
patent: 3030512 (1962-04-01), Harker
patent: 3102952 (1963-09-01), Hendee et al.
patent: 3150261 (1964-09-01), Furbee et al.
patent: 3198944 (1965-08-01), Furbee
patent: 4080171 (1978-03-01), Sano et al.
patent: 4134012 (1979-01-01), Smallbone et al.
patent: 4748636 (1988-05-01), Osada et al.
P. A. Lee et al., Extended X-Ray Absorption Fine Structure--Its Strengths and Limitations as a Structural Tool, Review of Modern Physics, vol. 53, No. 4, (Oct. 1981).

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