Method for analyzing and representing x-ray projection...

Details Method for analyzing and representing x-ray projection... Method for analyzing and representing x-ray projection...

2006-04-21

2008-12-23

Glick, Edward J (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Absorption

C378S048000, C382S132000, C250S363090

Reexamination Certificate

active

07469034

ABSTRACT:
The invention relates to a method and an x-ray examination unit for analyzing and representing x-ray projection images with an x-ray examination unit, where the function relation bU=ƒU−1(J˜/J0) is established between the attenuation value and a material-equivalent value as a function of the energy spectrum used, and for the purposes of projection representation, the magnitude of the material-equivalent value bUof a specific material is represented as an image value.

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