Optics: measuring and testing – Of light reflection
Reexamination Certificate
2006-05-01
2009-12-15
Pham, Hoa Q (Department: 2886)
Optics: measuring and testing
Of light reflection
C356S318000
Reexamination Certificate
active
07633622
ABSTRACT:
A microscope with evanescent sample illumination and a method for testing samples are disclosed. A first evanescent field, which exhibits a first penetration depth in the sample, and a second evanescent field, which exhibits a second penetration depth in the sample that is greater than the first penetration depth, are produced. A detector is provided that detects the first detection light, which exits from the part of the sample illuminated with the first evanescent field, and which produces first detection light data therefrom, and the second detection light, which exits from the part of the sample illuminated with the second evanescent field, and which produces second detection light data therefrom. Furthermore, a processing module is provided for processing the first and second detection light data.
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Hecker Andreas
Knebel Werner
Moellmann Kyra
Ulrich Heinrich
Houston Eliseeva LLP
Leica Microsystems CMS GmbH
Pham Hoa Q
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