Method for analyzing a measurement value and measurement value a

Details Method for analyzing a measurement value and measurement value a Method for analyzing a measurement value and measurement value a

1997-04-28

1998-11-10

Trammell, James P.

Data processing: measuring, calibrating, or testing

Measurement system

Statistical measurement

702182, G01B 1700

Patent

active

058358862

ABSTRACT:
A method for analyzing or conditioning a measurement value identified in a system process of a measurement system and a measurement value analyzer for carrying out the method, test the measurement value for plausibility at a first comparison point with reference to characteristic variables specific to the measurement system. In order to achieve a particularly high degree of reliability when monitoring the measurement value for errors, the consistency of the measurement value with measurement parameters identified independently of the measurement value, is tested at a second comparison point with reference to rules characteristic of the system process. A confidence factor for the measurement value is identified in dependence on a result of the testing.

REFERENCES:
patent: 4642782 (1987-02-01), Kemper et al.
patent: 4644479 (1987-02-01), Kemper et al.
patent: 4649515 (1987-03-01), Thompson et al.
patent: 5089978 (1992-02-01), Lipner et al.
patent: 5127005 (1992-06-01), Oda et al.
patent: 5132920 (1992-07-01), Bellows et al.
patent: 5293323 (1994-03-01), Doskocil et al.
patent: 5329465 (1994-07-01), Arcella et al.
Patent Abstract of Japan No. 4198729 (Takehito), dated Jul. 20,1992.
"Knowledge based fault diagnosis for technical processes" (Isermann), AT/ Automatisierungstechnik, Nov. 1988, No. 11.
"Measurement and Control", vol. 22 No. 5,Jun. 1989, pp. 132-141.
"Power Plant On-Line Diagnostic System for Turbines, Generators and Water Chemistry" (Dr. I. J. King) Advances in Instrumentation, Part 1, 1988, pp. 133-149.

Affiliated with

Also associated with

Rating

Method for analyzing a measurement value and measurement value a does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for analyzing a measurement value and measurement value a, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for analyzing a measurement value and measurement value a will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1528667