Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2006-10-31
2006-10-31
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C702S130000
Reexamination Certificate
active
07130758
ABSTRACT:
Analytical solutions to error bounds on the temperature depth distribution have been given in this invention. Solving the one dimensional steady state heat conduction equation for different sets of boundary conditions and radiogenic heat generation and incorporating Gaussian randomness in the thermal conductivity analytical closed form solutions to the mean and variance in the temperature depth distribution have been obtained. These closed form analytical solutions of mean and variance for the temperature field for different conditions have been used to compute and display the plot and results of the temperature depth profiles along with its error bounds. Quantifying the error statistics in the system output due to errors in the system input is very essential for a better evaluation of the system behavior. Earth Scientists involved in understanding the subsurface thermal structure relevant to geodynamical studies will benefit using these findings.
REFERENCES:
patent: 2004/0243311 (2004-12-01), Srivastava et al.
Srivastava et al., “A Stochastic model to quantify the steady-state crustal geotherms subject to uncertainties in thermal conductivity”, Sep. 1999, Geophysical Journal International, vol. 138 Issue 3, p. 895-899.
Fatima Bushra
Sharma Rohit
Singh R. N.
Srivastava Kirti
Cherry Stephen J.
Council of Scientific and Industrial Research
Nghiem Michael
Nixon & Vanderhye P.C.
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