Method for analysis of an ablated surface, analysis on...

Details Method for analysis of an ablated surface, analysis on... Method for analysis of an ablated surface, analysis on...

2007-10-09

2007-10-09

Farah, A. (Department: 3735)

Surgery

Instruments

Light application

C606S004000, C128S898000

Reexamination Certificate

active

10511897

ABSTRACT:
A method and an apparatus for evaluating ablation conditions easily and for ablating a target object accurately. The method includes irradiating a reference object with a laser beam under laser irradiation conditions determined to form a second curved surface shape on the reference object having a first curved surface shape approximate to a curved surface shape of the target object, measuring a third curved shape which has actually been formed by the laser irradiation, and determining a discrepancy between the second and the third curved surface shapes. Then, data about ablation or data for controlling a laser irradiation apparatus are corrected based on results of the determination.

REFERENCES:
patent: 5624436 (1997-04-01), Nakamura et al.
patent: 5637109 (1997-06-01), Sumiya
patent: 5906608 (1999-05-01), Sumiya et al.
patent: 5907388 (1999-05-01), Fujieda
patent: 6033075 (2000-03-01), Fujieda et al.
patent: 6245058 (2001-06-01), Suzuki
patent: 6607521 (2003-08-01), Vinciguerra et al.
patent: 6932806 (2005-08-01), Nakamura
patent: 6994701 (2006-02-01), Okamoto et al.
patent: 0 947 158 (1999-10-01), None
patent: 06-114083 (1994-04-01), None
patent: 6-226471 (1994-08-01), None
patent: 09-266925 (1997-10-01), None
patent: 10-108837 (1998-04-01), None
patent: 11-342152 (1999-12-01), None
patent: 2002-065719 (2002-03-01), None
International Search Report dated Aug. 20, 2002.

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