Metal fusion bonding – Process – With measuring – testing – indicating – inspecting – or...
Reexamination Certificate
2006-06-27
2006-06-27
Johnson, Jonathan (Department: 1725)
Metal fusion bonding
Process
With measuring, testing, indicating, inspecting, or...
C156S064000, C700S121000
Reexamination Certificate
active
07066373
ABSTRACT:
In order to eliminate the inclination of a semiconductor chip picked by a gripper, the height of at least three points on the underneath of the semiconductor chip is determined in relation to a reference surface and from this the inclination is calculated. Determining the heights takes place in that the semiconductor chip is lowered until the semiconductor chip comes into contact with a needle.
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Johnson Jonathan
Ritchie David B.
Thelen Reid & Priest LLP
Unaxis International Trading Ltd
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