Electricity: measuring and testing – Magnetic – With temperature control of material or element of test circuit
Patent
1991-09-05
1992-06-23
Snow, Walter E.
Electricity: measuring and testing
Magnetic
With temperature control of material or element of test circuit
324226, 324262, 356432, 374 4, 374 45, G01R 3500, G01R 3100, G01N 2714, G01N 2720
Patent
active
051246406
ABSTRACT:
An improved NDE method utilizes a laser source with modulator and scanning mirror, a pancake shape eddy current detecting coil, a lock-in amplifier, a system controller, and an impedance gain/phase analyzer. The laser is directed by the scanning mirror to a specimen to be analyzed. A very localized or small area of the specimen is impacted directly by the laser beam creating a thermal and stress wave in the specimen. An impedance gain/phase analyzer is connected to the eddy current detecting coil and to a lock-in amplifier through the system controller. The lock-in amplifier is also synchronized to the laser modulator. The system controller is used to control the lock-in amplifier, scanning mirror, and to process data from the analyzer. Raster scanning of the laser beam across the speciment allows the detection by the coil of the laser generated thermal and elastic strains induced in the specimen by the laser. The rastering of the laser beam is controlled by the controller by positioning the mirror.
REFERENCES:
patent: 4950990 (1990-08-01), Moulder et al.
International Advances in Nondestructive Testing, 1989, pp. 175-218.
McGraw-Hill Encyclopedia of Science & Technology, vol. 11, 1987, pp. 28-33.
Review of Progress in Quantititative Nondestructive Evaluation, vol. 9, 1990, pp. 533-538.
Clohan Paul S.
Marchant R. Dennis
Miller Guy M.
Snow Walter E.
The United States of Americas as represented by the Administrato
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