Metal working – Method of mechanical manufacture – Electrical device making
Reexamination Certificate
2007-09-04
2007-09-04
Tugbang, A. Dexter (Department: 3729)
Metal working
Method of mechanical manufacture
Electrical device making
C029S025410, C029S025420, C029S829000, C029S831000, C029S832000, C174S255000, C174S258000, C333S012000, C361S306300, C361S763000, C361S794000
Reexamination Certificate
active
10647939
ABSTRACT:
A method for adjusting the equivalent series resistance (ESR) of a multi-layer component includes providing at least first and second layers separated by an insulating layer, providing a resistive layer between the inslulating layer and one of the first or second electrode layers, and adjusting the ESR of the component by varying the effective resistance of the resistive layer. The effective resistance may be varied by adjusting the composition or thickness of the resistive layer. Alternatively, the effective resistance may be varied by forming a plurality of through-holes perforating one of the electrode layers and by then adjusting the respective diameters of selected of the through-holes to vary the extent of coverage on the resistive layer. An additionally disclosed feature of the present subject matter is to incorporate dielectric layers of varied thicknesses to broaden the resonancy curve associated with a particular mutli-layer component configuration.
REFERENCES:
patent: 4439813 (1984-03-01), Dougherty et al.
patent: 4831494 (1989-05-01), Arnold et al.
patent: 5164699 (1992-11-01), Smith et al.
patent: 5220482 (1993-06-01), Takemura et al.
patent: 5517385 (1996-05-01), Galvagni et al.
patent: 5576926 (1996-11-01), Monsorno
patent: 5599757 (1997-02-01), Wilson et al.
patent: 5786978 (1998-07-01), Mizuno
patent: 5799379 (1998-09-01), Galvagni et al.
patent: 5811868 (1998-09-01), Bertin et al.
patent: 5831810 (1998-11-01), Bird et al.
patent: 5880925 (1999-03-01), DuPré et al.
patent: 5886867 (1999-03-01), Chivukula et al.
patent: 5926377 (1999-07-01), Nakao et al.
patent: 6023408 (2000-02-01), Schaper
patent: 6034864 (2000-03-01), Naito et al.
patent: 6038121 (2000-03-01), Naito et al.
patent: 6038122 (2000-03-01), Bergstedt et al.
patent: 6104597 (2000-08-01), Konushi
patent: 6184574 (2001-02-01), Bissey
patent: 6208501 (2001-03-01), Ingalls et al.
patent: 6215372 (2001-04-01), Novak
patent: 6226170 (2001-05-01), Nellison et al.
patent: 6243253 (2001-06-01), DuPré et al.
patent: 6370011 (2002-04-01), Naitó et al.
patent: 6407907 (2002-06-01), Ahiko et al.
patent: 6573584 (2003-06-01), Nagakari et al.
patent: 6606237 (2003-08-01), Naito et al.
patent: 1115129 (2001-07-01), None
patent: 08330187 (1996-12-01), None
PCT International Search Report, International Application No. PCT/US02/28100, International Filing Date: Sep. 5, 2002, Date of completion of International Search: Oct. 9, 2003, Date of mailing of International Search Report: Jan. 2, 2003.
Galvagni John L.
Heistand, II Robert
Korony Georghe
AVX Corporation
Dority & Manning P.A.
Phan Tim
Tugbang A. Dexter
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