Method for adjusting illumination parameters of a laser...

Radiant energy – Photocells; circuits and apparatus – Photocell controlled circuit

Reexamination Certificate

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C250S205000

Reexamination Certificate

active

06737628

ABSTRACT:

BACKGROUND OF THE INVENTION
Field of the Invention
The invention relates to the field of laser imagesetters and, in particular, to their tuning for the purpose of optimizing the image quality of a photosensitive material that is illuminated in a laser imagesetter and is subsequently developed, in particular, during illumination tests, in the event of a change between different photosensitive materials or in the event of a variation in their properties.
The tuning of commercially available laser imagesetters to the photosensitive material to be illuminated, for example, films, pieces of paper, or printing plates, which usually needs to be carried out in the event of a change of the material or in the event of a change to its properties by the manufacturer, usually takes place with the aid of test illuminations. During these test illuminations, a particular test pattern is selected as a function of the material being used, and the photosensitive material is illuminated in the laser imagesetter with the test pattern, to evaluate it after developing, the criteria of the evaluation being different according to the material being used. For each of several possible imagesetter resolutions, a separate test run is carried out, during which the material being used is successively subjected to a filter test and a light test, to check by evaluating the developed test patterns whether or not optimum results can be obtained with the selected imagesetter adjustment. In addition, a focus test is carried out for each material to check the focus adjustment of the imagesetter with respect to the material being used.
Carrying out these test illuminations, however, takes a comparatively long time and entails a comparatively high workload. For instance, the time taken in the case of five possible imagesetter resolutions and an average duration of 10 minutes per test is almost 2 hours to carry out the 11 necessary tests (5 filter tests, 5 light tests, and 1 focus test). When two different materials are being used, for example, film and offset sheet, as many as 22 tests are necessary, and the time taken is, therefore, twice as long.
If the result of the test illuminations does not correspond to expectations, the test illuminations need to be carried out again after varying some of the imagesetter adjustments.
Variations in the imagesetter—material—developing machine process chain, for example, batch-dependent variations of the photosensitive material or variations due to ageing of developer chemicals, can also make it necessary to repeat the test illuminations.
The test illuminations are usually carried out according to the specifications, for the photosensitive material respectively being used, from the manufacturer who, prior to a market release, determines the imagesetter adjustments that are most suitable as a standard and supplies these to the customer while citing the respective manufacturer reference. The manufacturer references used by different manufacturers, however, are of different types and do not contain any information about material-specific properties, such as material thickness and material sensitivity, which would permit the customer to derive illumination parameters tailored to his or her own requirement from them.
SUMMARY OF THE INVENTION
It is accordingly an object of the invention to provide a method for adjusting illumination parameters of a laser imagesetter that overcomes the hereinafore-mentioned disadvantages of the heretofore-known devices and methods of this general type and that reduces the time taken and the workload for determining the correct imagesetter adjustment.
With the foregoing and other objects in view, there is provided, in accordance with the invention, a method for adjusting variable illumination parameters of a laser imagesetter, including the steps of defining variable illumination parameters of the laser imagesetter including at least one of the group consisting of laser power, focus adjustment, scan rate, and feed rate, adjusting the illumination parameters of the laser imagesetter during illumination tests of a photosensitive material by calculating at least some of the illumination parameters prior to the adjustment based upon imagesetter-independent characteristic data selected from at least one of the group consisting of material thickness, material sensitivity, material-specific test patterns, and material-specific evaluation criteria of the photosensitive material to be illuminated, and subsequently automatically adjusting the calculated illumination parameters.
According to a first aspect of the invention, at least some of the illumination parameters are calculated, prior to the adjustment, based upon imagesetter-independent characteristic data including material thickness, material sensitivity, material-specific test patterns, and/or material-specific evaluation criteria of the photosensitive material to be illuminated.
This aspect of the invention is based on the idea of replacing the instructions for carrying out the test illuminations by imagesetter-independent material-specific characteristic data, which are used as a basis for calculating suitable illumination parameters as well as for automating an illumination process and, in particular, test illuminations by corresponding automatic control of the laser imagesetter based upon the calculated illumination parameters.
The term imagesetter-independent characteristic data refers to material-specific data such as material thickness, material sensitivity, material-specific test patterns, and/or material-specific evaluation criteria, which can be given without reference to a particular laser imagesetter, although these characteristic data may also include data such as an imagesetter resolution, if this material-specific imagesetter resolution is suitable for arbitrary laser imagesetters.
From the imagesetter-independent characteristic data, the imagesetter-specific illumination parameters are, then, calculated in a particular laser imagesetter, or in a computer connected to it; besides the imagesetter-independent characteristic data, imagesetter-specific characteristic data, for example, laser-diode current, laser-diode power, filters, or shutters, also have an influence in the calculation.
The imagesetter-independent characteristic data are advantageously stored on a data medium, for example, a CD-ROM or a floppy disk, which can be read by the laser imagesetter or by a computer connected to the laser imagesetter, or they may be called up by the customer directly through data lines, for example, over the Internet from a homepage of the manufacturer of the imagesetter or of the photosensitive material. Taken together, the imagesetter-independent characteristic data of a material to be illuminated will be referred to below as material drivers, by analogy with corresponding terms in the computer sector.
To permit fast processing of the characteristic data, in accordance with another mode of the invention, prior to the illumination of a photosensitive material, suitable illumination parameters such as laser power, focus adjustment, scan rate, and/or feed rate be calculated by a processor integrated in the laser imagesetter, or a processor of a computer connected to the laser imagesetter, from its material drivers by using predetermined algorithms; the algorithm for calculating the laser power contains, as a variable, at least the material sensitivity, expressed as an energy density, and advantageously furthermore an imagesetter resolution that is suitable for the material and a scan rate that is dependent on the imagesetter resolution, while the algorithm for calculating the focus adjustment contains at least the material thickness as a variable.
In accordance with a further mode of the invention, advantageously, the calculation of the focus adjustment begins from a reference focal point, which has been determined beforehand at a defined temperature for a reference material with a defined material thickness; the algorithm for calculating the focus adjustment contains, as a variable, the difference

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