Coating processes – Measuring – testing – or indicating
Patent
1992-06-30
1997-07-01
Utech, Benjamin
Coating processes
Measuring, testing, or indicating
427 10, 427100, 427282, B05D 512
Patent
active
056436297
ABSTRACT:
Method and apparatus for adjusting the electrical parameters of monolithic crystal filters having an electrode pattern that includes resonator electrodes and inter-resonator gap and constitutes two coupled resonators, based on thin-film deposition on the electrode pattern of one side of the filter through a single-aperture mask, with mask and filter movable relatively to each other during the adjustment process, such as to be able to guide said deposition in response to measurements of said electrical parameters to any area of said electrode pattern for the purpose of adjusting said parameters to their target values.
REFERENCES:
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patent: 4112147 (1978-09-01), Thompson
patent: 4273812 (1981-06-01), Tsutsui et al.
patent: 4427711 (1984-01-01), Martin
patent: 4627379 (1986-12-01), Roberts et al.
patent: 4676993 (1987-06-01), Roberts et al.
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