Data processing: measuring – calibrating – or testing – Calibration or correction system
Reexamination Certificate
2007-07-31
2008-12-09
Feliciano, Eliseo Ramos (Department: 2857)
Data processing: measuring, calibrating, or testing
Calibration or correction system
C702S005000, C702S107000, C708S308000
Reexamination Certificate
active
07463990
ABSTRACT:
A method for adjusting an electronic system is provided in which it is possible to predefine the n parameters of the system which correspond to an n-dimensional adjustment space, wherein at the start of the adjustment each parameter has predefined for it two limit values that delimit an appropriate initial range in the n-dimensional adjustment space, and wherein the following steps are repeated until a termination condition is achieved: evaluating a target function that quantifies the achievement of an adjustment target for the limit values that delimit the initial range, wherein the evaluation includes the measurement and/or evaluation of at least one physical quantity of the system that is a function of the specific parameter or its limit value, and wherein appropriate target function values associated with the limit values are obtained, defining a modified, in particular reduced, initial range for a subsequent iteration as a function of the target function values obtained. According to the invention, the target function values are assigned to two different classes, wherein all target function values that correspond to a target criterion are assigned to a first class, and wherein all target values that do not correspond to the target criterion are assigned to a second class, and in that defining of the modified initial range for the subsequent iteration takes place as a function of the target function values assigned to the first class.
REFERENCES:
patent: 5402367 (1995-03-01), Sullivan et al.
patent: 5428712 (1995-06-01), Elad et al.
patent: 2003/0130975 (2003-07-01), Muller
patent: 2005/0148304 (2005-07-01), Jerng
patent: 2006/0064670 (2006-03-01), Linebarger et al.
Atmel Duisburg GmbH
Feliciano Eliseo Ramos
Muncy Geissler Olds & Lowe, PLLC
Suglo Janet L
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