Method for acquiring basic characteristic of simultaneous...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Pcb – mcm design

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C716S115000, C716S138000

Reexamination Certificate

active

08079012

ABSTRACT:
In an initial stage of device design, a circuit analysis control unit of an evaluation board stores SSO noise basic characteristic data actually measured by the evaluation board in an SSO noise basic characteristic data storage unit, and an SSO noise calculation unit calculates a rough amount of SSO noise on the basis of the SSO noise basic characteristic data. After a noise check is OR, the design proceeds, and a PCB parameter is determined, a circuit analysis control unit acquires the SSO noise basic characteristic data according to actual device PCB design information, and corrects the SSO noise basic characteristic data in the SSO noise basic characteristic data storage unit. Then, the SSO noise calculation unit performs a detailed analysis of an amount of SSO noise using the corrected SSO noise basic characteristic data.

REFERENCES:
patent: 6144176 (2000-11-01), Quinlan
patent: 7472367 (2008-12-01), Xie et al.
patent: 7698670 (2010-04-01), Masumura
patent: 2004/0010762 (2004-01-01), Habitz
patent: 2007/0162879 (2007-07-01), Tiwari
patent: 2008/0027662 (2008-01-01), Kouzaki et al.
patent: 10-127089 (1998-05-01), None
patent: 2004-205095 (2004-07-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for acquiring basic characteristic of simultaneous... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for acquiring basic characteristic of simultaneous..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for acquiring basic characteristic of simultaneous... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4269900

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.