Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-04-05
2005-04-05
Nguyen, Vinh P. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010
Reexamination Certificate
active
06876218
ABSTRACT:
A method for accurate testing of the output voltage of an integrated circuit comprises enabling a differential voltage comparator on the integrated circuit to be tested. One input to the differential comparator is set to a reference voltage, and the other input is coupled to a node to be tested. A current load is injected at the node, and the output of the voltage comparator can be used to determine if the integrated circuit performs within the specifications set by a manufacturer.
REFERENCES:
patent: 5436558 (1995-07-01), Saitoh et al.
patent: 5578935 (1996-11-01), Burns
patent: 5617037 (1997-04-01), Matsumoto
patent: 5942921 (1999-08-01), Talaga, Jr.
Lai Andrew W.
Simmons Tuyet Ngoc
Liu Justin
Nguyen Vinh P.
Xilinx , Inc.
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