Method, device and system for evaluating a lens for an...

Details Method, device and system for evaluating a lens for an... Method, device and system for evaluating a lens for an...

2006-08-09

2009-12-29

Lauchman, L. G (Department: 2877)

Optics: measuring and testing

Inspection of flaws or impurities

Transparent or translucent material

C356S239100, C356S237100, C250S559400, C250S559490

Reexamination Certificate

active

07639353

ABSTRACT:
The invention relates to a system, method and device for evaluating imperfections in a lens for a display for an electronic device. For the device, it comprises: a substrate; and a pattern imposed on the substrate. For the pattern, when the pattern is viewed through the lens, the pattern is noticeably distorted around an area where a defect is present in the lens. For the system, it comprises: an evaluation table for the lens, the table having a mounting area; and a substrate for mounting on the mounting area, the substrate having a pattern imposed thereon wherein when the pattern is viewed through the lens, the pattern is noticeably distorted around an area where a defect is present in the lens.

REFERENCES:
patent: 4876121 (1989-10-01), Cohen
patent: 5812260 (1998-09-01), Louisnathan
patent: 5847822 (1998-12-01), Sugiura et al.
patent: 6195164 (2001-02-01), Thompson et al.
patent: 7166856 (2007-01-01), Cho et al.
patent: 2002/0070000 (2002-06-01), Weyer et al.
patent: 2006/0017676 (2006-01-01), Bowers et al.
patent: 2006/0110580 (2006-05-01), Aylward et al.
patent: 2007/0046321 (2007-03-01), Kang et al.
patent: 1 061 329 (2000-12-01), None

Affiliated with

Also associated with

Rating

Method, device and system for evaluating a lens for an... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method, device and system for evaluating a lens for an..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method, device and system for evaluating a lens for an... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4073176