Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate
2007-06-28
2010-10-26
Lau, Tung S (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Quality evaluation
Reexamination Certificate
active
07822566
ABSTRACT:
Where substrates with components are produced through a series of production processes and inspected after each of these production processes, a method is provided for setting an optimum reference value for making judgments in these inspections such that the frequency of occurrence of disagreement between inspection results after an intermediate process and after the final results will come to within a specified range. After an initial value is assigned for a reference value, this value is sequentially varied while repeating specified processes of saving measured and judgment data on inspected portions of components in a memory and setting a reference value by using the data saved in the memory until a specified condition becomes satisfied.
REFERENCES:
patent: 5564183 (1996-10-01), Satou et al.
patent: 6757621 (2004-06-01), Mizuno et al.
patent: 1578186 (2005-09-01), None
patent: 05-108798 (1993-04-01), None
patent: 11-298200 (1999-10-01), None
EP patent application No. 07110486.3, European Search Report mailed Mar. 26, 2009.
Lau Tung S
OMRON Corporation
Sun Xiuquin
Weaver Austin Villeneuve & Sampson LLP
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