Method & circuit for testing ic logic circuits

Details Method & circuit for testing ic logic circuits Method & circuit for testing ic logic circuits

1995-09-26

1997-03-11

Voeltz, Emanuel T.

Excavating

371 225, G01R 3128

Patent

active

056109261

ABSTRACT:
Integrated logic circuit and method of functionally testing the integrated logic circuit, wherein the integrated logic circuit includes storage elements configurable as at least a part of a scan path in which a feedback from elements in the path to a previous element is provided. The method of functionally testing the integrated logic circuit effectively provides a simple exercising of the integrated logic circuit by clocking the elements in the scan path. In a specific aspect, the feedback arrangement provides a linear feedback shift register with exclusive-OR gating.

REFERENCES:
patent: 5043986 (1991-08-01), Agrawal et al.
patent: 5132974 (1992-07-01), Rosales
patent: 5225834 (1993-07-01), Imai et al.
patent: 5260947 (1993-11-01), Posse
patent: 5329533 (1994-07-01), Lin

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