Method, apparatus, system, program and medium for inspecting...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Details

C702S081000, C702S189000, C714S030000, C714S733000, C324S073100, C324S500000, C324S765010, C382S145000

Reexamination Certificate

active

07133797

ABSTRACT:
A method, apparatus, system, computer program and medium, for inspecting a wide variety of circuit boards. A controller generates test data and reference data according to characteristic information of a circuit board. Using the test data, the circuit board generates processed data. A comparator compares the processed data with the reference data on a bit-by-bit basis. Based on the comparison result, the comparator determines acceptability of the circuit board. In addition, the comparator is capable of specifying a specific portion of the circuit board causing a defect.

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Ockunzzi et al., ‘Test Strategies for BIST at the Algorithmic and Register-Transfer Levels’, Jan. 2002, NSF Publication, pp. 1-6.
Crane et al., ‘Tackling Advanced Technology Boards: Combining X-Ray and ICT’, Sep. 1999, Agilent Technology Publication, pp. 1-4.

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