Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-04-15
2008-04-15
Tieu, Benny Q (Department: 4177)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S537000, C324S260000
Reexamination Certificate
active
07358749
ABSTRACT:
Provided is a method, apparatus and program for calculating an electric-field vector that allows for grasping the intensity, direction and phase of electric field on a scanning plane for an appliance, and a medium storing the program. An electric-field vector at an origin is calculated, based on potential-difference vectors in respective coordinate directions calculated depending upon a detected signal of at least a magnitude and phase of an electric-field component current by arranging a scanning electric-field sensor at an origin of a desired coordinate system established near an object-to-be-measured, signals detected at respective coordinates by sequential movement to desired coordinates on respective coordinate axes, and a detected reference signal of at least a magnitude and phase of a current by fixedly arranging a fixed magnetic-field sensor close to the object-to-be-measured, and distances between coordinates calculated based on the coordinates the scanning electric-field sensor is arranged and the origin.
REFERENCES:
patent: 3715660 (1973-02-01), Ruhnke
patent: 4806851 (1989-02-01), Krider et al.
patent: 4829238 (1989-05-01), Goulette et al.
patent: 5574805 (1996-11-01), Toba et al.
patent: 6215294 (2001-04-01), Coleman
patent: 6411104 (2002-06-01), Uesaka et al.
patent: 6759850 (2004-07-01), Harzanu et al.
patent: 6804617 (2004-10-01), Kitayoshi
patent: 6922634 (2005-07-01), Odakura et al.
patent: 2006/0279273 (2006-12-01), Kazama
patent: 2004-69372 (2004-03-01), None
Kazama. (Electromagnetic Compatibility, 2002 IEEE International Symposium on vol. 1, Aug. 19-23, 2002 pp. 395-400.
Kazama. (Compliance Engineering Annual Reference Guide 2002).
Weinzierl et al. (Infrared and Millimeter Waves, 2000. Conference Digest. 2000 25th International Conference on Sep. 12-15, 2000 pp. 353-354.
Kazama Satoshi
Sakurada Masahiko
Tsutagaya Hiroshi
Knobbe Martens Olson & Bear LLP
Kusumakar Karen M
Taiyo Yuden Co. Ltd.
Tieu Benny Q
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