Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate
2011-04-19
2011-04-19
Teixeira Moffat, Jonathan C (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Quality evaluation
C702S181000, C702S182000
Reexamination Certificate
active
07930123
ABSTRACT:
A method for evaluating a sampling inspection. The method includes determining a first and a second sampling plan, and obtaining a first and a second measured value of a production lot based on the first and the second sampling plans, respectively. The method also includes calculating a first and a second acceptance variable based on the first and second measured values, respectively, and calculating a first and second acceptance probabilities based on the first and second acceptance variables, respectively. The method further includes calculating a first and a second operating characteristic of the first and second sampling plans based on the first and second acceptance probabilities, respectively, and evaluating the first and the second operating characteristics.
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patent: 7570797 (2009-08-01), Wang et al.
patent: 2004/0107062 (2004-06-01), Lawrence
patent: 2004/0210335 (2004-10-01), Chandra et al.
patent: 2007-235108 (2007-09-01), None
Dodge, H. F. et al., “Single Sampling and Double Sampling Inspection Tables,” The Bell System Technical Journal, vol. XX, No. 1, pp. 1-61, (Jan. 1941).
Military Standard, 'Sampling Procedures and Tables for Inspection by Variables for Percent Defective; Office of the Assistant Secretary of Defense, MIL-STD-414, pp. i-viii, and 1-110, (Jun. 11, 1957).
Asano Masafumi
Ikeda Takahiro
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Kabushiki Kaisha Toshiba
Teixeira Moffat Jonathan C
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