Method, apparatus and computer program product for high...

Details Method, apparatus and computer program product for high... Method, apparatus and computer program product for high...

2005-11-29

2005-11-29

Wachsman, Hal (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C324S512000

Reexamination Certificate

active

06970798

ABSTRACT:
For testing a device under test (“DUT”) a test specification is converted in a computer system by a pin vector generator process, which includes generating test vectors. The DUT has numerous input pins and such a pin vector is for a signal to drive one such pin. The pin vectors are compressed and saved. Ones of the pin vectors are loaded, upon initialization of a test, into a pipeline having a series of memory stages and extending from the computer system to channel cards in a test head. The pipeline is operated in data transfer cycles, delivering W bits per cycle. The pin vectors are decompressed at the respective channel cards in decompressor read cycles. X bits are read per decompressor cycle, W being greater than X, so that the pipeline may perform its data transfer cycles less frequently than the decompressor performs its read cycles.

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G. Chiu, et al, “Optical Space Transformer for Extending VLSI Testing into the Multi-Gigahertz Range,” IBM Technical Disclosure Bulletin, vol. 30, No. 10, Mar. 1988, pp. 229-233.

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