Method and testing apparatus for testing integrated circuits

Details Method and testing apparatus for testing integrated circuits Method and testing apparatus for testing integrated circuits

2007-02-26

2008-08-05

Nguyen, Ha (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07408375

ABSTRACT:
A method for testing integrated circuits comprises: generation of a change in an input signal of the integrated circuit, detection of a change in the output signal of the integrated circuit, the change triggered by the change in the input signal when a predetermined condition is satisfied, and a comparison of the detected output signal with at least one predetermined comparison criterion. Whereby, the predetermined condition is derived individually for each integrated circuit from a time response of the output signal.

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