Method and system to reduce low-frequency noise in semiconductor

Details Method and system to reduce low-frequency noise in semiconductor Method and system to reduce low-frequency noise in semiconductor

1981-12-08

1984-12-11

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

358167, H01J 4014

Patent

active

044880529

ABSTRACT:
To eliminate or suppress amplifier noise in amplifiers (6, 7) connected to a semiconductor light sensor, for example of a charge coupled type, in which the noise introduced by the amplifiers has a frequency spectrum which is low with respect to the clock frequency of operation of the sensor, the minimum value signal from the light sensor, as amplified, is determined; the maximum value of the signal, as amplified, is determined; and a reference is derived based on the minimum value, for example by clamping the minimum value, or utilizing the minimum value as a dynamic reference for subtraction from the maximum value, to thereby eliminate the effect of low-frequency shift of signals due to low-frequency noise of the amplifiers; various circuits may be used, such as clamping circuits (FIG. 3), threshold or non-additive mixing circuits (FIGS. 4, 5) coupled to a subtraction stage (24), band-pass filtering and envelope demodulation (FIG. 6: 28, 29, 30) or synchronous demodulation (FIG. 7: 34, 35) using the scanning clock frequency (36, 37) for synchronous demodulation, coupled with frequency limiting the output to, for example, one-half clock frequency in a low-pass filter (39).

REFERENCES:
patent: 4009334 (1977-02-01), Sypula
patent: 4317134 (1982-02-01), Woo et al.
patent: 4412190 (1983-10-01), Levine

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