X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate
2011-07-19
2011-07-19
Kiknadze, Irakli (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Absorption
C378S086000, C378S089000
Reexamination Certificate
active
07983387
ABSTRACT:
The different advantageous embodiments provide a system for identifying a likelihood of detecting objects with a backscatter x-ray system comprising a structure having a number of objects, a plurality of databases, and a processor unit configured to execute a detection analysis process. The processor unit executes the detection analysis process to identify the number of objects, identify a number of densities associated with each of the number of objects, determine a likelihood of detecting each of the number of objects with the backscatter x-ray system, and generate a three-dimensional diagram of the likelihood of detecting each of the number of objects.
REFERENCES:
patent: 6122344 (2000-09-01), Beevor
patent: 2008/0253637 (2008-10-01), Boyden et al.
“I.C. Contrast and Image Formation”, pp. 1-7, retrieved Sep. 10, 2009 http://em-outreach.ucsd.edu/web-course/Sec-I.C/Sec-I.C.html.
“Z Backscatter: power, effectiveness and safety”, pp. 1-4, retrieved Sep. 10, 2009 http://www.as-e.com/products—solutions/Z—backscatter.asp.
Engel James E.
Toh Chin Hoi
Wright Rodney Stephen
Kiknadze Irakli
The Boeing Company
Yee & Associates P.C.
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