X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate
2006-06-20
2006-06-20
Glick, Edward J. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Absorption
Reexamination Certificate
active
07065176
ABSTRACT:
A system and method to inspect a component is disclosed. The system to inspect a component may include an x-ray source to direct an x-ray beam through the component and an x-ray detector to detect the x-ray beam after passing through the component. A processor may be included to transform coordinates on an x-ray detection panel of the x-ray detector that detect any defects to a digital representation of locations on the component of any defects.
REFERENCES:
patent: 4260889 (1981-04-01), Osborn et al.
patent: 5119408 (1992-06-01), Little et al.
patent: 5778043 (1998-07-01), Cosman
patent: 5985680 (1999-11-01), Singhal et al.
patent: 6459760 (2002-10-01), D'Ambrosio
patent: 2002/0181650 (2002-12-01), D'Ambrosio
patent: 01299447 (1989-04-01), None
patent: WO 9954717 (1999-10-01), None
Brehm John Robert
Galish Andy Joseph
Graber Dean Fredrich
La Tulippe Michael Timothy
Little Francis Howard
General Electric Company
Glick Edward J.
Moore Charles L.
Moore and Van Allen PLLC
Ramaswamy V. G.
LandOfFree
Method and system to inspect a component does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and system to inspect a component, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system to inspect a component will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3647200