Method and system to check an electronic metrological...

Details Method and system to check an electronic metrological... Method and system to check an electronic metrological...

2011-07-05

2011-07-05

Korzuch, William (Department: 2431)

Data processing: generic control systems or specific application

Specific application, apparatus or process

Article handling

C700S237000, C700S241000, C700S266000, C700S295000, C705S076000, C705S078000, C702S061000, C380S047000, C380S251000, C380S287000, C726S004000, C726S006000, C713S155000, C713S156000, C713S157000, C713S175000, C713S176000, C713S169000, C713S180000, C713S182000, C713S192000, C713S194000

Reexamination Certificate

active

07974734

ABSTRACT:
Control system of an electronic instrument for metrological measurements, comprising an electronic local processing unit including a handling application of said instrument. The system includes a control application for said handling application, which can be associated with said local processing unit, said control application being suitable for generating a univocal certification code for the application.

REFERENCES:
patent: 6119110 (2000-09-01), Carapelli
patent: 6292569 (2001-09-01), Shear et al.
patent: 6360138 (2002-03-01), Coppola et al.
patent: 6442448 (2002-08-01), Finley et al.
patent: 6904592 (2005-06-01), Johnson
patent: 7376934 (2008-05-01), Steinrisser et al.
patent: 2003/0196102 (2003-10-01), McCarroll
patent: 0736484 (1996-10-01), None
patent: 2342453 (2000-04-01), None
Patent Abstracts of Japan vol. 1995, No. 1, Feb. 28, 1995, JP 06 300603 A (Ricoh Seiki Co Ltd), Oct. 28, 1994.
International Search Report for PCT/EP2003/12826 prepared by the European Patent Office on Apr. 7, 2004 and mailed on Jun. 21, 2004.

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