Optics: measuring and testing – Angle measuring or angular axial alignment – Apex of angle at observing or detecting station
Reexamination Certificate
2006-09-20
2008-10-07
Tarcza, Thomas H. (Department: 3662)
Optics: measuring and testing
Angle measuring or angular axial alignment
Apex of angle at observing or detecting station
Reexamination Certificate
active
07433029
ABSTRACT:
A preferably parametrically defined calibration target pattern definable in real-world coordinates (Xi,Yi) is used to spatially calibrate a camera system acquiring images in pixel coordinates (xi,yi). The calibration target pattern is used to produce a unique 1:1 mapping enabling the camera system to accurately identify each point in the calibration target pattern point mapped to each pixel in the acquired image. Preferably the calibration target pattern is pre-distorted and includes at least two sinusoids that create a pattern of distorted wavefronts that when imaged by the camera system will appear substantially linearized. Since wavefront locations on the calibration target pattern were known, a mapping between those wavefronts and the substantially linearized wavefront pattern on the camera system captured image can be carried out. Demodulation of the captured image enables recovery of the continuous wave functions therein, using spectral analysis and iteration.
REFERENCES:
patent: 2006/0056655 (2006-03-01), Wen et al.
Canesta, Inc.
Canesta, Inc.
Kaufman, Esq. Michael A.
Ratcliffe Luke D
Tarcza Thomas H.
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