Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate
2011-08-30
2011-08-30
Decady, Albert (Department: 2121)
Data processing: generic control systems or specific application
Specific application, apparatus or process
Product assembly or manufacturing
C073S714000, C073S426000, C373S031000, C373S032000, C216S037000
Reexamination Certificate
active
08010225
ABSTRACT:
A method and system is provided for monitoring manufacturing equipment and, more particularly, for monitoring manufacturing equipment in a semiconductor fabrication facility using existing tool elements. The method includes operating a tool working at an operating mode such that at least one of its control parameters is outside of a normal operating range, and measuring the at least on of the control parameters of the tool working at the operating mode outside of the normal operating range. The method further includes detecting a change to a condition of the tool based on the measuring of the at least one control parameter.
REFERENCES:
patent: 3711212 (1973-01-01), Kuck
patent: 4150560 (1979-04-01), Wieland
patent: 5269203 (1993-12-01), Ueda
patent: 6546820 (2003-04-01), Van et al.
patent: 6615090 (2003-09-01), Blevins et al.
patent: 6984833 (2006-01-01), Sano et al.
patent: 7165011 (2007-01-01), Kaushal et al.
patent: 7258838 (2007-08-01), Li et al.
patent: 7695984 (2010-04-01), Monkowski et al.
patent: 2001/0026949 (2001-10-01), Ogawa et al.
patent: 2005/0026434 (2005-02-01), Huy et al.
patent: 2005/0252455 (2005-11-01), Moriya et al.
patent: 2005/0263072 (2005-12-01), Balasubramanian et al.
patent: 2006/0031788 (2006-02-01), Bauer
patent: 2006/0064188 (2006-03-01), Ushiku et al.
patent: 2006/0090731 (2006-05-01), Hoshino et al.
patent: 2006/0124242 (2006-06-01), Kanarik et al.
patent: 2006/0172829 (2006-08-01), Ishio
patent: 2006/0174701 (2006-08-01), Musashi et al.
patent: 2006/0223202 (2006-10-01), Choi et al.
patent: 2006/0234514 (2006-10-01), Gianoulakis et al.
patent: 2007/0201016 (2007-08-01), Song et al.
patent: 2007/0238199 (2007-10-01), Yamashita
patent: 2008/0067146 (2008-03-01), Onishi et al.
patent: 2008/0228315 (2008-09-01), Wendner et al.
patent: 2009/0164038 (2009-06-01), Bretschneider et al.
De'cady Albert
International Business Machines - Corporation
Lin Jason
MacKinnon Ian D.
Roberts Mlotkowski Safran & Cole P.C.
LandOfFree
Method and system of monitoring manufacturing equipment does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and system of monitoring manufacturing equipment, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system of monitoring manufacturing equipment will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2786788