Method and system of characterizing a device under test

Details Method and system of characterizing a device under test Method and system of characterizing a device under test

2006-08-29

2006-08-29

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Parameter related to the reproduction or fidelity of a...

C324S638000, C324S601000

Reexamination Certificate

active

07098670

ABSTRACT:
A system and method of characterizing a device under test wherein a signal is injected into the device under test, the response to the injected signal is measured to determine the impedance of the device under test in the frequency domain, the impedance is converted to the time domain, and the voltage noise of the device under test is calculated based on the impedance of the device under test in the time domain.

REFERENCES:
patent: 4816767 (1989-03-01), Cannon et al.
patent: 5502392 (1996-03-01), Arjavalingam et al.
patent: 5946482 (1999-08-01), Barford et al.
patent: 6653848 (2003-11-01), Adamian et al.

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