Data processing: measuring – calibrating – or testing – Calibration or correction system – Timing
Reexamination Certificate
2006-11-07
2006-11-07
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Timing
C711S167000
Reexamination Certificate
active
07133790
ABSTRACT:
The present invention relates to a method and system of calibrating the control delay time, providing effective calibration for the control delay time provided by a control chip to reach the optimal effect for effective reading. The control chip uses the connected buffer chip to produce a training sequence when the buffer chip enters a training mode. After the control chip receives the training sequence, the control chip will produce the training data to compare with the predefined pattern inside it and adjust the control delay time. Finally, the control chip will produce an optimal adjusting control delay time to allow the data strobe signal to control the effective retrieved range of the data.
REFERENCES:
patent: 6587804 (2003-07-01), Johnson et al.
Cherry Stephen J.
Jianq Chyun IP Office
Nghiem Michael
VIA Technologies Inc.
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