Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-08-09
2005-08-09
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C702S117000
Reexamination Certificate
active
06927591
ABSTRACT:
A tester comprises test logic and a connector for at least one device under test. The connector, which may comprise a wafer probe for dice on a wafer or a test fixture or either packaged integrated circuit devices or circuit board modules, has connections for the device under test that present an impedance selected to emulate the characteristic impedance of an end-use environment of the device under test. For example, in an embodiment in which the device under test comprises DDR memory and the end-use environment is a DDR memory module, the characteristic impedance is approximately 60 ohms. Because this accurate simulation is available even for dice on a wafer, the needless expense associated with packaging defective dies and assembling defective dies into modules can be avoided.
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Dillon & Yudell LLP
Russell Brian F.
Tang Minh N.
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