Method and system for visualizing surface errors

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S601000

Reexamination Certificate

active

07372558

ABSTRACT:
A method and system for visualizing deviations on an actual surface10, 30from a nominal, or designed, surface28utilizes a system and method for mapping the spatial (e.g. x, y and z) coordinates of the actual surface10, 30into a computer13, comparing the mapped actual surface to the nominal surface28to produce a three-dimensional distribution of deviation values (D), processing this distribution into a topographical pattern34of multiple contours or areas34a. . . 34n, each contour or area having the same, or generally the same, deviation value (D), and optically projecting this topographical pattern34onto the actual surface10, 30in registry with the initial surface mapping to provide a display of the surface deviations (D) directly on the actual surface10, 30. The deviations are measured along a direction D normal to the actual surface so that the three-dimensional distribution is given in x, y, D coordinates. The optical projection is preferably a laser projection38. The mapping and projection onto the actual surface10, 30are made, and coordinated with one another, with respect to three reference points32on the surface10, 30.

REFERENCES:
patent: 4811253 (1989-03-01), Johns
patent: 5090804 (1992-02-01), Wong et al.
patent: 5196900 (1993-03-01), Pettersen
patent: 5341183 (1994-08-01), Dorsey-Palmateer
patent: 5416591 (1995-05-01), Yoshimura et al.
patent: 5615013 (1997-03-01), Rueb et al.
patent: 5627771 (1997-05-01), Makino
patent: 5646859 (1997-07-01), Petta et al.
patent: 5663795 (1997-09-01), Rueb
patent: 5671053 (1997-09-01), Wigg et al.
patent: 5889582 (1999-03-01), Wong et al.
patent: 5957559 (1999-09-01), Rueb et al.
patent: 6024449 (2000-02-01), Smith
patent: 6036319 (2000-03-01), Rueb et al.
patent: 6044170 (2000-03-01), Migdal et al.
patent: 6066845 (2000-05-01), Rueb et al.
patent: 6320654 (2001-11-01), Alders et al.
patent: 6365221 (2002-04-01), Morton
patent: 6639660 (2003-10-01), Beck et al.
patent: 7193696 (2007-03-01), Engelbart et al.
patent: 2004/0247170 (2004-12-01), Furze et al.
patent: 003301494 (1984-07-01), None
patent: 197 30 885 (1999-01-01), None
patent: 0 997 201 (2000-05-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and system for visualizing surface errors does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and system for visualizing surface errors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for visualizing surface errors will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2766128

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.