Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Reexamination Certificate
2011-06-07
2011-06-07
Noori, Max (Department: 2855)
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
73
Reexamination Certificate
active
07954385
ABSTRACT:
A sensor element material web for selectively cutting an operable sensor from the web includes a sensor film. A first electrode film is disposed on a first side and includes metallic electrodes in a first repeating pattern. A second electrode film is disposed on a second side and includes a plurality of second metallic electrodes in a second repeating pattern. A dielectric film is disposed on the first or the second electrode films. The first and the second repeating patterns permit the sensor to be cut.
REFERENCES:
patent: 3943614 (1976-03-01), Yoshikawa et al.
patent: 4370182 (1983-01-01), Becker et al.
patent: 4654546 (1987-03-01), Kirjavainen
patent: 4874659 (1989-10-01), Ando et al.
patent: 5871828 (1999-02-01), Volkert
patent: 5912759 (1999-06-01), Good et al.
patent: 5955014 (1999-09-01), Raukola et al.
patent: 5961762 (1999-10-01), Zelinka et al.
patent: 6996891 (2006-02-01), Raisanen
patent: 7185601 (2007-03-01), Carpenter et al.
patent: 2005/0131578 (2005-06-01), Weaver
patent: 2007/0184743 (2007-08-01), Nordlinder et al.
patent: 42 37 072 (1993-12-01), None
patent: 196 36 543 (1997-03-01), None
patent: 59-230123 (1984-12-01), None
patent: 90/16089 (1990-12-01), None
patent: 92/10070 (1992-06-01), None
patent: 95/01079 (1995-01-01), None
patent: 96/06718 (1996-03-01), None
patent: 97/39602 (1997-10-01), None
United States Office Action dated Apr. 20, 2005, from corresponding U.S. Appl. No. 10/018,413.
United States Office Action dated Apr. 1, 2009, from corresponding U.S. Appl. No. 10/996,263.
Joseph S. Shor, et al. “Characterization of Monolithic n-Type 6H-SiC Piezoresistive Sensing Elements” IEEE Transactions on Electron Devices, vol. 41, No. 5, May 1994.
Emfitech Oy
Katten Muchin & Rosenman LLP
Noori Max
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