Method and system for trimming voltage or current references

Details Method and system for trimming voltage or current references Method and system for trimming voltage or current references

2006-07-17

2008-09-09

Nguyen, Ha (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S763010, C324S1540PB, C324S701000, C714S724000

Reexamination Certificate

active

07423445

ABSTRACT:
Trim codes are determined for semiconductor devices under test (DUTs), wherein the trim codes correspond to voltage or current reference value adjustments that cause the DUTs to generate desired voltage or current reference values. The technique involves supplying respective trim codes simultaneously to the DUTs to cause them to generate trimmed analog voltage or current references, simultaneously feeding a test analog voltage or current reference having a preselected reference value to the DUTs, and for each DUT, comparing the value of the test analog reference to the values of the trimmed analog references to ascertain the crossing of the value of the test analog reference by the values of the trimmed references, whereby for each DUT the trim code corresponding to the value of the trimmed analog voltage or current reference immediately above or below the crossing is established as the preferred trim code to be used for that DUT.

REFERENCES:
patent: 6591210 (2003-07-01), Lorenz
patent: 6720800 (2004-04-01), Shyr et al.
patent: 6950339 (2005-09-01), Jeong et al.
patent: 7000160 (2006-02-01), Tanaka et al.
patent: 7277350 (2007-10-01), Huckaby et al.

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