Method and system for trend detection and analysis

Details Method and system for trend detection and analysis Method and system for trend detection and analysis

2006-05-02

2006-05-02

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Performance or efficiency evaluation

C702S179000, C702S181000, C702S189000

Reexamination Certificate

active

07039554

ABSTRACT:
A method for comparing a data set to a baseline value comprising: providing the data set to be analyzed; locating potentially bad data points in at least a portion of the data set using an odd-man out recursive technique; preparing a baseline set by discarding the potentially bad data points from the at least a portion of the data set; and calculating a baseline value from the baseline set.

REFERENCES:
patent: 4634110 (1987-01-01), Julich et al.
patent: 6027941 (2000-02-01), Jarvie et al.
patent: 6151582 (2000-11-01), Huang et al.
patent: 2002/0000126 (2002-01-01), Barclay

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