Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing
Reexamination Certificate
2011-07-12
2011-07-12
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
Physical design processing
C716S106000, C716S108000, C716S112000, C716S113000, C716S115000, C703S019000
Reexamination Certificate
active
07979825
ABSTRACT:
A method and system for determining electrical parameter data for a layer of an integrated circuit that can include a nominal electrical parameter value, and sensitivity values which represent the sensitivities of the nominal electrical parameter value to variations in the nominal parameter values. A template of the layer geometry is provided from a portion of which a set of linear equations are developed and which equations are solved using a two step method and from which solution the nominal electrical parameter values are determined. An auxiliary set of the original linear equations is developed from the original set using the adjoint method and from the solution of the auxiliary set using the two step method the sensitivity values are calculated.
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El Moselhy Tarek A.
Elfadel Ibrahim M.
Chiang Jack
Harrington & Smith
International Business Machines - Corporation
Nguyen Nha T
LandOfFree
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