Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-08-14
2007-08-14
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010, C324S073100, C714S733000
Reexamination Certificate
active
11018540
ABSTRACT:
A semiconductor device tester includes a parametric measurement unit (PMU) stage for producing a DC test signal and a pin electronics (PE) stage for producing an AC test signal to test a semiconductor device. A driver circuit is capable of providing a version of the DC test signal and a version of the AC test signal to the semiconductor device.
REFERENCES:
patent: 4947106 (1990-08-01), Chism
patent: 4998026 (1991-03-01), King
patent: 5101153 (1992-03-01), Morong, III
patent: 5200696 (1993-04-01), Menis et al.
patent: 5514976 (1996-05-01), Ohmura
patent: 5521493 (1996-05-01), Persons
patent: 5617035 (1997-04-01), Swapp
patent: 5754041 (1998-05-01), Kaito et al.
patent: 6028439 (2000-02-01), Arkin et al.
patent: 6498473 (2002-12-01), Yamabe
patent: 6574760 (2003-06-01), Mydill
patent: 6677775 (2004-01-01), Babcock
patent: 6687868 (2004-02-01), Furukawa et al.
patent: 6804620 (2004-10-01), Larson et al.
patent: 6828775 (2004-12-01), Chow et al.
patent: 6836136 (2004-12-01), Aghaeepour
patent: 6859902 (2005-02-01), Dalal et al.
patent: 6879175 (2005-04-01), Conner
patent: 6885213 (2005-04-01), Sunter
patent: 2005/0189950 (2005-09-01), Lu
Mercury, System on a Chip, 50 MHz Octal Pin Electronics with PMU; Planet ATE; Nov. 22, 2004.
Neptune, SOC Pin Electronics Companion PMU/DAC/Resistive Load; Planet ATE; Jun. 16, 2004.
Pluto, Octal PMU/VI with Ganging 5 MHz Pin Electronics; Planet ATE; Oct. 28, 2004.
Saturn, System on a Chip, Dual Channel Wide Voltage Pin Electronics Solution; Planet ATE; Jul. 19, 2005.
Venus, System on a Chip, Dual Channel 133 MHz Pin Electronics Solution; Planet ATE; Sep. 16, 2004.
International Search Report for Application No. PCT/Us05/45605.
Written Opinion for Application No. PCT/US05/45718.
Sartschev Ronald A.
Walker Ernest
Teradyne, Inc.
Vazquez Arleen M.
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